EIC Accelerator
The EIC Accelerator is a Horizon Europe funding program that provides assistance to start-ups and SMEs that have an innovative, game-changing product, service, or business model that has the potential to create new markets or disrupt existing ones, and have the ambition and commitment to scale up, are seeking substantial funding, but the risks involved are too high for private investors to invest alone
Past deals in Rotterdam
Nearfield Instruments
Venture Round in 2024
Nearfield Instruments B.V. is a company based in Rotterdam, the Netherlands, that specializes in the development and manufacture of High-Throughput Scanning Probe Metrology systems for the semiconductor industry. Founded in 2016, Nearfield Instruments focuses on enhancing process control in semiconductor manufacturing by enabling atomic-scale resolution in the analysis of integrated circuits. Their innovative technology allows for detailed scanning of chip surfaces during fabrication, which significantly improves production yields and the functionality of microchips. By offering advanced metrology solutions, Nearfield Instruments contributes to the production of smaller and more efficient electronic devices, marking a notable advancement over traditional metrology methods.
Nearfield Instruments
Grant in 2024
Nearfield Instruments B.V. is a company based in Rotterdam, the Netherlands, that specializes in the development and manufacture of High-Throughput Scanning Probe Metrology systems for the semiconductor industry. Founded in 2016, Nearfield Instruments focuses on enhancing process control in semiconductor manufacturing by enabling atomic-scale resolution in the analysis of integrated circuits. Their innovative technology allows for detailed scanning of chip surfaces during fabrication, which significantly improves production yields and the functionality of microchips. By offering advanced metrology solutions, Nearfield Instruments contributes to the production of smaller and more efficient electronic devices, marking a notable advancement over traditional metrology methods.
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