Nearfield Instruments B.V., founded in 2016 and based in Rotterdam, the Netherlands, specializes in the development and manufacturing of High-Throughput Scanning Probe Metrology systems designed for advanced integrated circuits. The company's innovative technology employs atomic-scale probes to scan surfaces of semiconductor samples, allowing for precise analysis of patterns and features at atomic resolution. This approach significantly enhances traditional metrology methods, enabling clients to improve production yields and the functionality of microchips during the fabrication process. Through its advanced systems, Nearfield Instruments addresses critical challenges in semiconductor manufacturing, contributing to the industry's evolution.
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